Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films


UFUKTEPE Y. , Akgul G., Aksoy F., Nordlund D.

X-RAY SPECTROMETRY, vol.40, no.6, pp.427-431, 2011 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 40 Issue: 6
  • Publication Date: 2011
  • Doi Number: 10.1002/xrs.1362
  • Title of Journal : X-RAY SPECTROMETRY
  • Page Numbers: pp.427-431

Abstract

We report on the near-edge X-ray absorption fine structure spectroscopy of the L(3) (2p(3/2)) and L(2) (2p(1/2)) edges for ferromagnetic pure nickel transition metal and show that the L(2,3) edge peak intensity and satellite feature at similar to 6 eV above the L(3) edge in nickel increase with increasing nickel film thickness both in the total electron yield and transmission modes. The absorption spectra of nickel metal, however, exhibit strong angular-dependent effects when measured in total electron yield mode. In addition, we calculated the mean electron escape depth of the emitted electrons (lambda(e)), which was found for pure nickel metal to be lambda(e) = 25 +/- 2 angstrom. We point out the advantages of the total electron yield technique for the study of the L-edge of 3d transition metals. Copyright (C) 2011 John Wiley & Sons, Ltd.