Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films

UFUKTEPE Y., Akgul G., Aksoy F., Nordlund D.

X-RAY SPECTROMETRY, cilt.40, sa.6, ss.427-431, 2011 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 40 Sayı: 6
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1002/xrs.1362
  • Dergi Adı: X-RAY SPECTROMETRY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.427-431
  • Çukurova Üniversitesi Adresli: Evet

Özet

We report on the near-edge X-ray absorption fine structure spectroscopy of the L(3) (2p(3/2)) and L(2) (2p(1/2)) edges for ferromagnetic pure nickel transition metal and show that the L(2,3) edge peak intensity and satellite feature at similar to 6 eV above the L(3) edge in nickel increase with increasing nickel film thickness both in the total electron yield and transmission modes. The absorption spectra of nickel metal, however, exhibit strong angular-dependent effects when measured in total electron yield mode. In addition, we calculated the mean electron escape depth of the emitted electrons (lambda(e)), which was found for pure nickel metal to be lambda(e) = 25 +/- 2 angstrom. We point out the advantages of the total electron yield technique for the study of the L-edge of 3d transition metals. Copyright (C) 2011 John Wiley & Sons, Ltd.