UFUKTEPE, Y. Et Al. 2011. Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films. X-RAY SPECTROMETRY , vol.40 , 427-431.

UFUKTEPE, Y., Akgul, G., Aksoy, F., & Nordlund, D., (2011). Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films. X-RAY SPECTROMETRY , vol.40, 427-431.

UFUKTEPE, YÜKSEL Et Al. "Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films," X-RAY SPECTROMETRY , vol.40, 427-431, 2011

UFUKTEPE, YÜKSEL Et Al. "Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films." X-RAY SPECTROMETRY , vol.40, pp.427-431, 2011

UFUKTEPE, Y. Et Al. (2011) . "Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films." X-RAY SPECTROMETRY , vol.40, pp.427-431.

@article{article, author={YÜKSEL UFUKTEPE Et Al. }, title={Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films}, journal={X-RAY SPECTROMETRY}, year=2011, pages={427-431} }