Improvement of the Intergranular Pinning Energy in the (BiPb)(2)Sr2Ca2Cu3O10+delta Superconductors Doped with High Valancy Cations


Yazici D., Erdem M., ÖZÇELİK B.

JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, cilt.25, sa.4, ss.725-729, 2012 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 25 Sayı: 4
  • Basım Tarihi: 2012
  • Doi Numarası: 10.1007/s10948-011-1331-1
  • Dergi Adı: JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.725-729
  • Anahtar Kelimeler: High-T-c superconductors, Magnetoresistance, Pinning energy, Flux pinning, HIGH-TEMPERATURE SUPERCONDUCTORS, ACTIVATED FLUX-CREEP, EASY VORTEX MOTION, MAGNETIC-FIELD, GD(BA2-XPRX)CU3O7+DELTA SYSTEM, DISSIPATION MECHANISM, TRANSPORT-PROPERTIES, CRITICAL CURRENTS, THIN-FILM, TRANSITION
  • Çukurova Üniversitesi Adresli: Evet

Özet

In the present work, Bi-Pb-V-Sr-Ca-Cu-Ti-O bulk samples with nominal composition (BiPb)(2)V (x) Sr2Ca3Cu4-y Ti (y) O12+delta with x=0.1 and y=0.050, 0.10, 0.2, and 0.3 have been prepared by the melt-quenching method. The magnetoresistance of the samples has been measured for different values of the applied magnetic field. The thermally activated flux creep model has been studied in order to calculate the flux pinning energies. The flux pinning energies calculated increase with increasing Ti-content, and decrease with applied magnetic field.

In the present work, Bi-Pb-V-Sr-Ca-Cu-Ti-O bulk samples with nominal composition (BiPb)(2)V (x) Sr2Ca3Cu4-y Ti (y) O12+delta with x=0.1 and y=0.050, 0.10, 0.2, and 0.3 have been prepared by the melt-quenching method. The magnetoresistance of the samples has been measured for different values of the applied magnetic field. The thermally activated flux creep model has been studied in order to calculate the flux pinning energies. The flux pinning energies calculated increase with increasing Ti-content, and decrease with applied magnetic field.