To evaluate the dopant effect precisely, X-ray diffraction (XRD) for structural, scanning electron microscopy (SEM) with energy dispersive x-ray spectroscopy (EDS) analysis for morphological, photoluminescence (PL) and thermoluminescence (TL) characteristics of un-doped, 2.0 mol% Sm3+ doped and 2.0 mol% Sm3+;x mol% Mn2+ (x = 0.5, 1.0, 2.0, 4.0) doped Zn2SiO4 phosphors were tested. PL mechanisms of excitation and emission were discussed together with data on the structure and morphology of the samples. The beta doses from 0.1 to 500 Gy with various steps were applied to observe the glow curve readouts after 200 °C preheat at a linear heating rate of 2 °C/s from RT to 500 °C. Zn2SiO4:2.0%Sm3+;0.5%Mn2+ was chosen for further analysis due to having both the most PL and TL peak area. Various heating rate method was used to determine the kinetic parameters as well as initial rise with TM-Tstop analysis and computerized glow curve deconvolution methods.