Revisiting the analysis of impedance data for double layer capacitance


Ozcan M.

ANALYST, vol.140, no.15, pp.5216-5219, 2015 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 140 Issue: 15
  • Publication Date: 2015
  • Doi Number: 10.1039/c5an01020a
  • Title of Journal : ANALYST
  • Page Numbers: pp.5216-5219

Abstract

A method was developed to extract double layer capacitance (C-dl) from data displaying time constant dispersion at a frequency where the phase angle reached its maximum (f(1)). This method was implemented in a set of synthetic data and the Kramers-Kronig (K-K) transformable experimental data for mild steel in an acidic solution. The double layer capacitance values were compared with ones extracted from the constant phase element (CPE) parameters, Y-o and alpha, at a frequency where the imaginary part of the impedance reached its maximum (f(2)). A significant closeness of the results was reached for two different frequencies.