Comparison Of Marginal Models With Gee Random Effect Models For The Repeated Binary Data And Frailty Models For The Analysis Of Multivariate Failure Time Data | AVESİS

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Comparison Of Marginal Models With Gee Random Effect Models For The Repeated Binary Data And Frailty Models For The Analysis Of Multivariate Failure Time Data

Atıf İçin Kopyala

BURGUT H. R. , Rockette H. E. , EROL H. , SERTDEMİR Y.

XXI International Biometric Conference, Freiburg, Almanya, 21 - 26 Temmuz 2002

Basıldığı Şehir: Freiburg
Basıldığı Ülke: Almanya