Temperature dependent change of the MnSK-edge


Ozkendir O., Ufuktepe Y.

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, cilt.7, ss.2655-2660, 2005 (SCI İndekslerine Giren Dergi) identifier

  • Cilt numarası: 7 Konu: 5
  • Basım Tarihi: 2005
  • Dergi Adı: JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
  • Sayfa Sayıları: ss.2655-2660

Özet

The x-ray absorption near-edge structure (XANES) of Mn K-edge in MnS have been investigated. The full multiple scattering approach has been applied to the calculation of Mn K edge XANES spectra of MnS. The calculations are based on different choices of one electron potentials according to Manganese coordinations by using the real space multiple scattering method FEFF 8 code. The crystallographic and electronic structure of the MnS are tested at various temperature ranges from 300 to 573 K. We have found prominent changes in the XANES spectra of MnS by the change of the temperature. Such observed changes are explained by considering the structural, electronic and spectroscopic properties. The results are consistent with experimental spectra.