X-ray photoabsorption and total electron yield of Fe thin films at the L-2,L-3 edge


Ufuktepe Y. , Akgul G., Luning J.

JOURNAL OF ALLOYS AND COMPOUNDS, cilt.401, ss.193-196, 2005 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 401
  • Basım Tarihi: 2005
  • Doi Numarası: 10.1016/j.jallcom.2005.02.056
  • Dergi Adı: JOURNAL OF ALLOYS AND COMPOUNDS
  • Sayfa Sayıları: ss.193-196

Özet

We have studied thin Fe films by soft X-ray absorption spectroscopy to determine the total electron yield (TEY) sampling depth (gimel(e)) at the Fe L-2,L-3 edge. For this, we have recorded high-resolution X-ray absorption spectra in TEY resolving the near edge X-ray absorption fine structure (NEXAFS). Our analysis yields a value of gimel(e) = 21 +/- 2 A for the TEY sampling depth. (c) 2005 Elsevier B.V. All rights reserved.