X-ray photoabsorption and total electron yield of Fe thin films at the L-2,L-3 edge


Ufuktepe Y. , Akgul G., Luning J.

JOURNAL OF ALLOYS AND COMPOUNDS, vol.401, pp.193-196, 2005 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 401
  • Publication Date: 2005
  • Doi Number: 10.1016/j.jallcom.2005.02.056
  • Title of Journal : JOURNAL OF ALLOYS AND COMPOUNDS
  • Page Numbers: pp.193-196

Abstract

We have studied thin Fe films by soft X-ray absorption spectroscopy to determine the total electron yield (TEY) sampling depth (gimel(e)) at the Fe L-2,L-3 edge. For this, we have recorded high-resolution X-ray absorption spectra in TEY resolving the near edge X-ray absorption fine structure (NEXAFS). Our analysis yields a value of gimel(e) = 21 +/- 2 A for the TEY sampling depth. (c) 2005 Elsevier B.V. All rights reserved.