X-ray photoabsorption and total electron yield of Fe thin films at the L-2,L-3 edge
JOURNAL OF ALLOYS AND COMPOUNDS, cilt.401, ss.193-196, 2005 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 401
- Basım Tarihi: 2005
- Doi Numarası: 10.1016/j.jallcom.2005.02.056
- Dergi Adı: JOURNAL OF ALLOYS AND COMPOUNDS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.193-196
- Çukurova Üniversitesi Adresli: Evet
Özet
We have studied thin Fe films by soft X-ray absorption spectroscopy to determine the total electron yield (TEY) sampling depth (gimel(e)) at the Fe L-2,L-3 edge. For this, we have recorded high-resolution X-ray absorption spectra in TEY resolving the near edge X-ray absorption fine structure (NEXAFS). Our analysis yields a value of gimel(e) = 21 +/- 2 A for the TEY sampling depth. (c) 2005 Elsevier B.V. All rights reserved.