4d-4f and 3d-4f resonant photoemission of TmX (X = S, Se, Te)

Kimura, S; Ufuktepe, YÜKSEL; Nath, KG; Kinoshita, T; Kumigashira, H; Takahashi, T; Matsumura, T; Suzuki, T; Ogasawara, H; Kotani, A

doi:10.1016/s0304-8853(97)00558-1

4d-4f and 3d-4f resonant photoemission of TmX (X = S, Se, Te)

Atıf İçin Kopyala

Kimura S., Ufuktepe Y., Nath K., Kinoshita T., Kumigashira H., Takahashi T., ...Daha Fazla

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, cilt.177, ss.349-350, 1998 (SCI-Expanded)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 177
Basım Tarihi: 1998
Doi Numarası: 10.1016/s0304-8853(97)00558-1
Dergi Adı: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Sayfa Sayıları: ss.349-350
Çukurova Üniversitesi Adresli: Hayır

Özet

The electronic structures of thulium monochalcogenides (TmX; X = S, Se, Te) were studied both experimentally and theoretically using resonant photoemission around the Tm 4d and 3d absorption edges. The fundamental electronic structures and the mean valences are analyzed. (C) 1998 Elsevier Science B.V. All rights reserved.