4d-4f and 3d-4f resonant photoemission of TmX (X = S, Se, Te)

Kimura, S; Ufuktepe, YÜKSEL; Nath, KG; Kinoshita, T; Kumigashira, H; Takahashi, T; Matsumura, T; Suzuki, T; Ogasawara, H; Kotani, A

doi:10.1016/s0304-8853(97)00558-1

4d-4f and 3d-4f resonant photoemission of TmX (X = S, Se, Te)

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Kimura S., Ufuktepe Y., Nath K., Kinoshita T., Kumigashira H., Takahashi T., ...More

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, vol.177, pp.349-350, 1998 (SCI-Expanded)

Publication Type: Article / Article
Volume: 177
Publication Date: 1998
Doi Number: 10.1016/s0304-8853(97)00558-1
Journal Name: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Page Numbers: pp.349-350
Çukurova University Affiliated: No

Abstract

The electronic structures of thulium monochalcogenides (TmX; X = S, Se, Te) were studied both experimentally and theoretically using resonant photoemission around the Tm 4d and 3d absorption edges. The fundamental electronic structures and the mean valences are analyzed. (C) 1998 Elsevier Science B.V. All rights reserved.