4d-4f and 3d-4f resonant photoemission of TmX (X = S, Se, Te)


Kimura S., Ufuktepe Y. , Nath K., Kinoshita T., Kumigashira H., Takahashi T., et al.

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, cilt.177, ss.349-350, 1998 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 177
  • Basım Tarihi: 1998
  • Doi Numarası: 10.1016/s0304-8853(97)00558-1
  • Dergi Adı: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
  • Sayfa Sayısı: ss.349-350

Özet

The electronic structures of thulium monochalcogenides (TmX; X = S, Se, Te) were studied both experimentally and theoretically using resonant photoemission around the Tm 4d and 3d absorption edges. The fundamental electronic structures and the mean valences are analyzed. (C) 1998 Elsevier Science B.V. All rights reserved.