Manganese sulfide thin films have been investigated by X-ray Absorption Fine Structure spectroscopy (XAFS). XAFS provides a description of the structure of the films. The paper also presents a structural characterisation of the wurtzite MnS thin films and their crystallisation behaviour by annealing at increasing temperatures. The x-ray absorption fine structure (XAFS) of Mn K-edge and S K-edge in wurtzite MnS have been investigated. The full multiple scattering approach has been applied to the calculation of Mn K edge XANES spectra of MnS. The calculations are based on different choices of one electron potentials according to Mn coordinations by using the real space multiple scattering method FEFF 8.0 code. The crystallographic and electronic structure of the MnS are tested at various temperature ranges from 300 to 573 K. We have found prominent changes in the XANES spectra of Mangeanese sulfide thin films by the change of the temperature. Such observed changes are explained by considering the structural, electronic and spectroscopic properties. The results are consistent with experimental spectra.