Elaboration and Characterisation of Zn/CuIn3Se5 Thin Films

Yandjah L., Kavak H. , Bechiri L.

6th International Conference on Nanomaterials - Applications & Properties (NAP), Lviv, Ukrayna, 14 - 19 Eylül 2016 identifier identifier


Zn/CuIn3Se5 polycrystalline thin films have been deposited by flash evaporation on a Corning 7059 glass substrates. The films have been investigated by X-ray diffraction (XRD) for the phase structure, scanning electron microscopy, atomic force microscopy (AFM) for the morphology and optical transmission to determine the band gap. X-ray patterns revealed that Zn/CuIn3Se5 films are polycrystalline in nature with a tetragonal structure and lattice parameters a = 5.646 A \ anc = 11.292 A after annealing at temperature of 400 degrees C. The optical properties in the near-infrared and visible range [500-2500] nm were determined from spectral transmission data. The absorption coefficient a is about 10(4) cm(-1) and the band gap has been found around 1.292 eV.