Deviance residual-based Shewhart control chart for monitoring Conway-Maxwell-Poisson profile under the <i>r-k</i> class estimator
Atıf İçin Kopyala
Mammadova U., ÖZKALE ATICIOĞLU M. R.
QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, 2023 (SCI-Expanded)
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Yayın Türü:
Makale / Tam Makale
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Basım Tarihi:
2023
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Doi Numarası:
10.1080/16843703.2023.2259589
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Dergi Adı:
QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT
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Derginin Tarandığı İndeksler:
Science Citation Index Expanded (SCI-EXPANDED), Scopus, Applied Science & Technology Source, Business Source Elite, Business Source Premier, Compendex, Computer & Applied Sciences, INSPEC
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Anahtar Kelimeler:
Conway-Maxwell-Poisson distribution, principal component regression, profile monitoring, ridge estimator, residual control chart, percentile
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Çukurova Üniversitesi Adresli:
Evet