Deviance residual-based Shewhart control chart for monitoring Conway-Maxwell-Poisson profile under the <i>r-k</i> class estimator
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Mammadova U., ÖZKALE ATICIOĞLU M. R.
QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, 2023 (SCI-Expanded)
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Publication Type:
Article / Article
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Publication Date:
2023
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Doi Number:
10.1080/16843703.2023.2259589
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Journal Name:
QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT
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Journal Indexes:
Science Citation Index Expanded (SCI-EXPANDED), Scopus, Applied Science & Technology Source, Business Source Elite, Business Source Premier, Compendex, Computer & Applied Sciences, INSPEC
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Keywords:
Conway-Maxwell-Poisson distribution, principal component regression, profile monitoring, ridge estimator, residual control chart, percentile
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Çukurova University Affiliated:
Yes