Deviance residual-based Shewhart control chart for monitoring Conway-Maxwell-Poisson profile under the <i>r-k</i> class estimator

Mammadova U., ÖZKALE ATICIOĞLU M. R.

QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, 2023 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Publication Date: 2023
  • Doi Number: 10.1080/16843703.2023.2259589
  • Journal Name: QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Applied Science & Technology Source, Business Source Elite, Business Source Premier, Compendex, Computer & Applied Sciences, INSPEC
  • Keywords: Conway-Maxwell-Poisson distribution, principal component regression, profile monitoring, ridge estimator, residual control chart, percentile
  • Çukurova University Affiliated: Yes