ÖZDEMİR, B. Et Al. 2015. Electron-Transport Properties of a ZnMgO/ZnO Hetero Structure and the Effect of Interface Roughness and ZnMgO Thickness. JOURNAL OF ELECTRONIC MATERIALS , vol.44, no.10 , 3733-3737.

ÖZDEMİR, B., Yarar, Z., Ozdemir, M. D. , ATASEVER, O. S. , & ÖZDEMİR, M., (2015). Electron-Transport Properties of a ZnMgO/ZnO Hetero Structure and the Effect of Interface Roughness and ZnMgO Thickness. JOURNAL OF ELECTRONIC MATERIALS , vol.44, no.10, 3733-3737.

ÖZDEMİR, BERRİN Et Al. "Electron-Transport Properties of a ZnMgO/ZnO Hetero Structure and the Effect of Interface Roughness and ZnMgO Thickness," JOURNAL OF ELECTRONIC MATERIALS , vol.44, no.10, 3733-3737, 2015

ÖZDEMİR, BERRİN Et Al. "Electron-Transport Properties of a ZnMgO/ZnO Hetero Structure and the Effect of Interface Roughness and ZnMgO Thickness." JOURNAL OF ELECTRONIC MATERIALS , vol.44, no.10, pp.3733-3737, 2015

ÖZDEMİR, B. Et Al. (2015) . "Electron-Transport Properties of a ZnMgO/ZnO Hetero Structure and the Effect of Interface Roughness and ZnMgO Thickness." JOURNAL OF ELECTRONIC MATERIALS , vol.44, no.10, pp.3733-3737.

@article{article, author={BERRİN ÖZDEMİR Et Al. }, title={Electron-Transport Properties of a ZnMgO/ZnO Hetero Structure and the Effect of Interface Roughness and ZnMgO Thickness}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2015, pages={3733-3737} }