ESEN, M. And ESEN, M. 2019. Characterization of DLC Thin Films Deposited on Glass and Si Substrates under The Influence of Electric Field with ECR-MP Method. TURKISH PHYSICAL SOCIETY 35th INTERNATIONAL PHYSICS CONGRESS (TPS35) , (Muğla, Turkey), 298-303.

ESEN, M., & ESEN, M., (2019). Characterization of DLC Thin Films Deposited on Glass and Si Substrates under The Influence of Electric Field with ECR-MP Method . TURKISH PHYSICAL SOCIETY 35th INTERNATIONAL PHYSICS CONGRESS (TPS35) (pp.298-303). Muğla, Turkey

ESEN, MEHMET, And MUSTAFA ESEN. "Characterization of DLC Thin Films Deposited on Glass and Si Substrates under The Influence of Electric Field with ECR-MP Method," TURKISH PHYSICAL SOCIETY 35th INTERNATIONAL PHYSICS CONGRESS (TPS35), Muğla, Turkey, 2019

ESEN, MEHMET And ESEN, MUSTAFA. "Characterization of DLC Thin Films Deposited on Glass and Si Substrates under The Influence of Electric Field with ECR-MP Method." TURKISH PHYSICAL SOCIETY 35th INTERNATIONAL PHYSICS CONGRESS (TPS35) , Muğla, Turkey, pp.298-303, 2019

ESEN, M. And ESEN, M. (2019) . "Characterization of DLC Thin Films Deposited on Glass and Si Substrates under The Influence of Electric Field with ECR-MP Method." TURKISH PHYSICAL SOCIETY 35th INTERNATIONAL PHYSICS CONGRESS (TPS35) , Muğla, Turkey, pp.298-303.

@conferencepaper{conferencepaper, author={MEHMET ESEN And author={MUSTAFA ESEN}, title={Characterization of DLC Thin Films Deposited on Glass and Si Substrates under The Influence of Electric Field with ECR-MP Method}, congress name={TURKISH PHYSICAL SOCIETY 35th INTERNATIONAL PHYSICS CONGRESS (TPS35)}, city={Muğla}, country={Turkey}, year={2019}, pages={298-303} }