Gode, F. Et Al. 2011. Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films. 17th International Conference on Microscopy of Semiconducting Materials , (Cambridge, Canada).

Gode, F., GÜNERİ, E., Kariper, A., Ulutas, C., Kirmizigul, F., & GÜMÜŞ, C., (2011). Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films . 17th International Conference on Microscopy of Semiconducting Materials, Cambridge, Canada

Gode, F. Et Al. "Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films," 17th International Conference on Microscopy of Semiconducting Materials, Cambridge, Canada, 2011

Gode, F. Et Al. "Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films." 17th International Conference on Microscopy of Semiconducting Materials , Cambridge, Canada, 2011

Gode, F. Et Al. (2011) . "Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films." 17th International Conference on Microscopy of Semiconducting Materials , Cambridge, Canada.

@conferencepaper{conferencepaper, author={F. Gode Et Al. }, title={Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films}, congress name={17th International Conference on Microscopy of Semiconducting Materials}, city={Cambridge}, country={Canada}, year={2011}}